请选择 进入手机版 | 继续访问电脑版

EDABOSS电子论坛

 找回密码
 立即注册
搜索
热搜: 活动 交友 discuz
查看: 481|回复: 0

[资料共享] Field Emission Scanning Electron Microscopy: New Perspectives for Materials...

[复制链接]

13

主题

2

回帖

70

E币

技术员

Rank: 2

积分
28
发表于 2019-11-25 10:21:44 | 显示全部楼层 |阅读模式

捕获.PNG


Since a few years, recent developments in the field of scanning electron microscopy have led to extending the range of application of SEM, especially in the characterization of thin specimens with low voltage scanning transmission electron microscopy (STEM). More specifically, Kikuchi diffraction techniques by transmission emerged with the parallel work of Keller (Keller and Geiss 2012), Trimby (2012) and Brodusch (Brodusch et al. 2013a, b) which now allows orientation mapping and phase identification of nanomaterials with a spatial resolution close to that obtAIned with a transmission electron microscope (TEM). Recently, a new type of electron backscatter diffraction (EBSD) camera with the screen normal to the electron beam direction was introduced on the market.


Field Emission Scanning Electron Microscopy:New Perspectives for Materials.pdf (7.08 MB, 下载次数: 0)

积分规则
回复

使用道具 举报

您需要登录后才可以回帖 登录 | 立即注册

本版积分规则

Archiver|手机版|小黑屋|EDABOSS电子论坛

GMT+8, 2024-3-28 17:11 , Processed in 0.042047 second(s), 23 queries .

Powered by Discuz! X3.4

© 2001-2023 Discuz! Team.

快速回复 返回顶部 返回列表